The center houses a PHI VersaProbe II Scanning XPS Microprobe with 128 channel detector. Scanning x-ray microprobe technology, that provides high performance XPS large area spectroscopy, superior micro-area spectroscopy, chemical imaging, and secondary electron imaging with a raster scanned 10 µm diameter x-ray beam. The information XPS provides about chemical compositions is of great value in basic research as well as in many industrial applications including: nanostructures, thin films, polymer surface modification, catalysis, corrosion, adhesion, semiconductor, dielectric materials and magnetic media.
User request form:
To use the XPS system, please complete the time request form below and mail the signed form to: